Soft X-ray Spectrometer

X-ray emission spectroscopy, XES, measures the intensity distribution of soft X-rays emitted due to radiative decay of a core hole. With an attenuation length of photons in this energy range of typically hundreds of nanometers, the method is inherently bulk sensitive.

In XES problems encountered with electron spectroscopy, such as charging or disturbance from electromagnetic fields, are not present. XES makes measurements of insulators, large bandgap semiconductors and ferromagnets feasible. The bulk sensitivity of XES makes it possible to study buried layers such as corrosion-sensitive films covered by an inert capping layer. 

XES350

The Scienta XES 350 is a state-of-the-art soft X-ray emission spectrometer. It is a grazing incidence spectrometer covering a wide energy range, 50 -1000 eV, at high resolution and sensitivity [J. Nordgren et al., Rev. Sci. Instr. 60, 1690 (1989)]. The Scienta XES 350 is easily adapted to different excitation sources, since the instrument is flange mounted and has an optical axis that is easily adjusted to the excitation source. On to product page