R4000 with Lens 2

Spectromicroscopy/XPS Imaging as well as angle resolved measurements are possible with the R4000 Lens 2 models. Better than 10 micrometer spatial resolution is possible in combination with the proven high resolution of the R4000 spectrometer series. Models are offered featuring lens tables and electronics for XPS/UPS/ARPES and spectromicroscopy with different degrees of magnification.

The lens focuses photoelectrons from a certain spot on the sample to a corresponding point on an imaging plane. The spatial information is conserved though the analyser, and the energy dispersion for each point along the slit is determined. This method allows fast parallel acquisitions in contrast to small spot XPS where the lateral resolution originates from a focussed spot light source that is scanned across the sample. The chemical distribution over an extended area is determined by moving the manipulator position in the direction across the slit.

R4000 XPS/UPS/ARPES Spectromicroscopy

XPS Imaging as well as ARPES is possible with the R4000 XPS/UPS/ARPES Spectromicroscopy analyzer. The analyzer is fully equipped for XPS, UPS, and ARPES studies with lens tables angular and transmission mode measurements. Imaging modes with four different degrees of magnification is included. Kinetic energies from 0.5 eV – 1500 eV are measured with a selection of slits and wide range of pass energies from 1-500. Guaranteed energy resolution <1.8 meV at 20 eV kinetic energy. On to product page

R4000 XPS/UPS Spectromicroscopy

Spectromicroscopy and XPS Imaging is possible using the R4000 XPS/UPS Spectromicroscopy analyzer. The spectometer is equipped for XPS and UPS studies as well as imaging measurements with four different magnification modes. Kinetic energies from 0.5 eV – 1500 eV are measured with a selection of slits and wide range of pass energies from 1-500. Guaranteed energy resolution <1.8 meV at 20 eV kinetic energy. On to product page